Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Silica Solutions

[en] We propose a mathematical modeling of the total SAXS intensity in silica sol-gel processes in terms of hydrolysis and condensation reactions, as well as of microsyneresis. The results are used to rationalize previously published SAXS data of TEOS solutions reacting with organically modified trialkoxysilanes. We notably show that the decrease in SAXS intensity reported for these samples at the end of gelation is a consequence of condensation reactions. The water released by the latter reactions contributes to reduce the electron density difference between the silica and the solvent phases of the gels

Disciplines :

Physics
Chemistry

Author, co-author :

Gommes, Cédric ; Université de Liège - ULiège > Département de chimie appliquée > Génie chimique - Génie catalytique

Pirard, Jean-Paul ; Université de Liège - ULiège > Département de chimie appliquée > Génie chimique - Génie catalytique

Goderis, Bart; Katholieke Universiteit Leuven - KUL

Language :

English

Title :

Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Silica Solutions

Publication date :

2010

Journal title :

Journal of Physical Chemistry. C, Nanomaterials and interfaces

ISSN :

1932-7447

eISSN :

1932-7455

Publisher :

American Chemical Society, Washington, United States - District of Columbia

Volume :

114

Pages :

17350–17357

Peer reviewed :

Peer Reviewed verified by ORBi

Funders :

F.R.S.-FNRS - Fonds de la Recherche Scientifique

Available on ORBi :

since 16 November 2010

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