Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements

Reference : Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Re...


	Document type :	Scientific congresses and symposiums : Paper published in a book
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/2268/75164

Title :	Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements
Language :	English
Author, co-author :	Vandenrijt, Jean-François [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
	Thizy, Cédric [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
	Alexeenko, Igor [Universität Stuttgart > Institut für Technische Optik > > >]
	Jorge, Iagoba [Centro de Tecnologias Aeronauticas > > > >]
	Lopez, Ion [Centro de Tecnologias Aeronauticas > > > >]
	Saez de Ocariz, Idurre [Centro de Tecnologias Aeronauticas > > > >]
	Pedrini, Giancarlo [Universität Stuttgart > Institut für Technische Optik > > > >]
	Osten, Wolfgang [Universität Stuttgart > Institut für Technische Optik > > >]
	Georges, Marc [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
Publication date :	Sep-2009
Main document title :	Fringe 2009
Editor :	Osten, Wolfgang
	Kujawinska, Malgorzata
Publisher :	Springer
Pages :	596-599
Peer reviewed :	No
On invitation :	No
Audience :	International
ISBN :	978-3-642-03050-5
City :	Berlin
Country :	Allemagne
Event name :	Fringe 2009 - 6th International Workshop on Advanced Optical Metrology
Event date :	du 14 au 16 septembre 2009
Event organizer :	Universität Stuttgart
Event place (city) :	Nürtingen
Event country :	Allemagne
Keywords :	[en] Infrared ; Speckle Interferometry
Funders :	Union Européenne = European Union - UE = EU
Target :	Researchers ; Professionals ; Students
Permalink :	http://hdl.handle.net/2268/75164

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