[en] A bismuth silicon oxide crystal is used in the diffusion regime as a dynamic recording medium in a real-time holographic interferometer based on anisotropic self-diffraction. This device is connected with an interferogram-analysis method that uses the phase-shifting technique for quantitative measurement of diffusive-reflecting object deformations. In addition to the usual error sources in phase shifting, the temporal interferogram erasure is studied and is found weakly perturbative for the measured phase. Itis shown that quantitative measurements are possible for low-intensity object beams (8 μW/cm2) and a large observed area. Apractical situation of defect monitoring in a composite structure is presented.
Disciplines :
Physics
Author, co-author :
Georges, Marc ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Lemaire, Philippe
Language :
English
Title :
Phase-shifting real time interferometry that uses bismut silicon oxide crystals
Publication date :
10 November 1995
Journal title :
Applied optics. Optical Technology and Biomedical Optics
ISSN :
1540-8981
eISSN :
1539-4522
Publisher :
Optical Society of America, Washington, United States - District of Columbia
scite shows how a scientific paper has been cited by providing the context of the citation, a classification describing whether it supports, mentions, or contrasts the cited claim, and a label indicating in which section the citation was made.
Bibliography
C. M. Vest, Holographic Interferometry (Wiley, New York, 1979).
P. K. Rastogi, ed., Holographic interferometry: Principles and Methods, Vol. 68 of Springer Series in Optical Sciences (Springer-Verlag, Berlin, 1994).
P. Smigielski, Holographie Industrielle (Teknea, Toulouse, 1994).
P. Hariharan, Optical Holography: Principles, Techniques and Applications, Vol. 2 of Cambridge Studies in Modern Optics (Cambridge U. Press, Cambridge, UK, 1986).
P. Günter and J.-P. Huignard, eds., Photorefractive Materials and Their Applications: Survey of Applications, Vol. 62 of Topics in Applied Physics (Springer-Verlag, Berlin, 1989).
M. P. Petrov, S. I. Stepanov, and A. V. Khomenko, Photorefractive Crystals in Coherent Optical Systems, Vol. 59 of Springer Series in Optical Sciences (Springer-Verlag, Berlin, 1991).
S. I. Stepanov, "Applications of photorefractive crystals, " Rep. Prog. Phys. 57, 39-116(1994).
P. Günter and J.-P. Huignard, eds., Photorefractive Materials and Their Applications: Fundamental Phenomena, Vol. 61 of Topics in Applied Physics (Springer-Verlag, Berlin, 1988).
H. J. Tiziani, "Real-time metrology with BSO crystals, " Opt. Acta 29, 463-470(1982).
R. C. Troth and J. C. Dainty, "Holographic interferometry using anisotropic self-diffraction in Bi12SiO20, " Opt. Lett. 16, 53-55(1991).
V. I. Vlad, D. Popa, M. P. Petrov, and A. A. Kamshilin, "Optical testing by dynamic holographic interferometry with photorefractive crystals and computer image processing, " in Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, C. Grover, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1332, 237-244 (1990).
D. Dirksen and G. von Bally, "Holographic double-exposure interferometry in near real time with photorefractive crystals, " J. Opt. Soc. Am. B 11, 1858-1863(1994).
H. J. Tiziani, "Fringe analysis in holography with BSO applications, " in Second French-German Congress on Applications of Holography, P. Smigielski, ed. (H0L03, Saint-Louis, France, 1988).
A. A. Kamshilin and M. P. Petrov, "Continuous reconstruction of holographic interferograms through anisotropic diffraction in photorefractive crystals, " Opt. Commun. 53, 23-26 (1985).
H. Kogelnik, "Coupled-wave theory of thick hologram gratings, " Bell Syst. Tech. J. 48, 2909-2947 (1969).
S. Mallick, D. Rouède, and A. G. Apostolidis, "Efficiency and polarization characteristics of photorefractive diffraction in a Bi12SiO20 crystal, " J. Opt. Soc. Am. B 4, 1247-1259 (1987).
A. Marrakchi, R. V. Johnson, and A. R. Tanguay, Jr., "Polarization properties of photorefractive diffraction in electro-optic and optically active sillenite crystals (Bragg regime), " J. Opt. Soc. Am. B 3, 321-336(1986).
D. W. Robinson and G. T. Reid, eds., Interferogram Analysis: Digital Fringe Pattern Measurement Techniques (Institute of Physics, London, 1993).
T. M. Kreis, "Review of digital processing of holographic interferograms, " in Third French-German Congress on Applications of Holography, P. Smigielski, ed. (H0L03, Saint-Louis, France, 1991).
This website uses cookies to improve user experience. Read more
Save & Close
Accept all
Decline all
Show detailsHide details
Cookie declaration
About cookies
Strictly necessary
Performance
Strictly necessary cookies allow core website functionality such as user login and account management. The website cannot be used properly without strictly necessary cookies.
This cookie is used by Cookie-Script.com service to remember visitor cookie consent preferences. It is necessary for Cookie-Script.com cookie banner to work properly.
Performance cookies are used to see how visitors use the website, eg. analytics cookies. Those cookies cannot be used to directly identify a certain visitor.
Used to store the attribution information, the referrer initially used to visit the website
Cookies are small text files that are placed on your computer by websites that you visit. Websites use cookies to help users navigate efficiently and perform certain functions. Cookies that are required for the website to operate properly are allowed to be set without your permission. All other cookies need to be approved before they can be set in the browser.
You can change your consent to cookie usage at any time on our Privacy Policy page.
