[en] A bismuth silicon oxide crystal is used in the diffusion regime as a dynamic recording medium in a real-time holographic interferometer based on anisotropic self-diffraction. This device is connected with an interferogram-analysis method that uses the phase-shifting technique for quantitative measurement of diffusive-reflecting object deformations. In addition to the usual error sources in phase shifting, the temporal interferogram erasure is studied and is found weakly perturbative for the measured phase. Itis shown that quantitative measurements are possible for low-intensity object beams (8 μW/cm2) and a large observed area. Apractical situation of defect monitoring in a composite structure is presented.
Disciplines :
Physics
Author, co-author :
Georges, Marc ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Lemaire, Philippe
Language :
English
Title :
Phase-shifting real time interferometry that uses bismut silicon oxide crystals
Publication date :
10 November 1995
Journal title :
Applied optics. Optical Technology and Biomedical Optics
ISSN :
1540-8981
eISSN :
1539-4522
Publisher :
Optical Society of America, Washington, United States - District of Columbia
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