Article (Scientific journals)
On the Impact of Electron Spectroscopies (Versus Optical Techniques) to Study Organized Organic Layers and Their Interfaces
Magnée, Raphael; Mekhalif, Zineb; Doneux, Catherine et al.
1998In Journal of Electron Spectroscopy and Related Phenomena, 88-91, p. 855-860
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Abstract :
[en] When preparing and characterizing ordered organic layers, knowledge of the structure of the ultra-thin fihns is often missing or difficult to gather. For different self-assembled layers of the thiol and carboxylic acid families, we show that this valuable type of information is obtainable with X-ray photoelectron spectroscopy (XPS) and high-resolution electron energyqoss spectroscopy (HREELS). Indeed, information on the film order and superficial composition is available through analysis of the core-level peak positions and widths (in XPS), and through study of the elastic peak width and angular distribution and analysis of the material excitation function (in HREELS). However, [or some insight into the crystallinity of the layer and intermolecular interactions, infrared spectroscopy in the grazing-angle absorption--reflection mode (IRASI appears to be complementary
Disciplines :
Chemistry
Author, co-author :
Magnée, Raphael;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Mekhalif, Zineb;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Doneux, Catherine;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Duwez, Anne-Sophie  ;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP. Present address: University of Liège
Grégoire, Chantal;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Riga, Joseph;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Delhalle, Joseph;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Pireaux, Jean-Jacques;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP
Language :
English
Title :
On the Impact of Electron Spectroscopies (Versus Optical Techniques) to Study Organized Organic Layers and Their Interfaces
Publication date :
1998
Journal title :
Journal of Electron Spectroscopy and Related Phenomena
ISSN :
0368-2048
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
88-91
Pages :
855-860
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 30 May 2010

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