Article (Scientific journals)
Chemical Recognition of Antioxidants and UV-light Stabilizers on the Surface of Polypropylene : Atomic Force Microscopy with Chemically Modified Tips
Duwez, Anne-Sophie; Poleunis, Claude; Bertrand, Patrick et al.
2001In Langmuir, 17, p. 6351-6357
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Keywords :
atomic force microscopy AFM; surfaces; molecular recognition; polymers
Abstract :
[en] We show in this paper that it is possible to locally detect additives on the surface of polypropylene with chemically modified atomic force microscopy (AFM) tips. Gold-coated AFM tips modified with methyl and hydroxyl terminated self-assembled alkanethiol monolayers were used to measure adhesion forces on a process-stabilizing agent (Irgafos 168), an antioxidant (Irganox 1010), and UV-light stabilizers (Tinuvin 770, Dastib 845, Chimassorb 944, and Hostavin N30). Pull-off force measurements carried out on these pure additive films have shown that it is possible to discriminate between antioxidants and UV-light stabilizers. We have evidenced a characteristic fingerprint for each additive, according to the functionality of the tip used and themediumwherein the force measurements are realized (water or nitrogen atmosphere). Similarly we have measured pull-off forces on a melt-pressed polypropylene sample stabilized with Irgafos 168, Irganox 1010, and Tinuvin 770. These adhesion force measurements show that the extreme surface of the polymer is mainly made of a layer of Tinuvin 770. These results have been compared to those obtained from time-of-flight secondary ion mass spectrometry measurements
Disciplines :
Chemistry
Author, co-author :
Duwez, Anne-Sophie  ;  Université catholique de Louvain. Present address: University of Liège
Poleunis, Claude;  Université catholique de Louvain
Bertrand, Patrick;  Université catholique de Louvain
Nysten, Bernard;  Université catholique de Louvain
Language :
English
Title :
Chemical Recognition of Antioxidants and UV-light Stabilizers on the Surface of Polypropylene : Atomic Force Microscopy with Chemically Modified Tips
Publication date :
2001
Journal title :
Langmuir
ISSN :
0743-7463
eISSN :
1520-5827
Publisher :
American Chemical Society, Washington, United States - District of Columbia
Volume :
17
Pages :
6351-6357
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 30 May 2010

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