atomic force microscopy AFM; surfaces; molecular recognition; polymers
Abstract :
[en] We show in this paper that it is possible to locally detect additives on the surface of polypropylene with
chemically modified atomic force microscopy (AFM) tips. Gold-coated AFM tips modified with methyl and
hydroxyl terminated self-assembled alkanethiol monolayers were used to measure adhesion forces on a
process-stabilizing agent (Irgafos 168), an antioxidant (Irganox 1010), and UV-light stabilizers (Tinuvin
770, Dastib 845, Chimassorb 944, and Hostavin N30). Pull-off force measurements carried out on these
pure additive films have shown that it is possible to discriminate between antioxidants and UV-light
stabilizers. We have evidenced a characteristic fingerprint for each additive, according to the functionality
of the tip used and themediumwherein the force measurements are realized (water or nitrogen atmosphere).
Similarly we have measured pull-off forces on a melt-pressed polypropylene sample stabilized with Irgafos
168, Irganox 1010, and Tinuvin 770. These adhesion force measurements show that the extreme surface
of the polymer is mainly made of a layer of Tinuvin 770. These results have been compared to those
obtained from time-of-flight secondary ion mass spectrometry measurements
Disciplines :
Chemistry
Author, co-author :
Duwez, Anne-Sophie ; Université catholique de Louvain. Present address: University of Liège
Poleunis, Claude; Université catholique de Louvain
Bertrand, Patrick; Université catholique de Louvain
Nysten, Bernard; Université catholique de Louvain
Language :
English
Title :
Chemical Recognition of Antioxidants and UV-light Stabilizers on the Surface of Polypropylene : Atomic Force Microscopy with Chemically Modified Tips
Publication date :
2001
Journal title :
Langmuir
ISSN :
0743-7463
eISSN :
1520-5827
Publisher :
American Chemical Society, Washington, United States - District of Columbia
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(b) Lianos, L.; Duc, T.M.; Reichimaier, S.; Hammond, J. In Proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry; Benninghoven, A., Ed.; Wiley: Chichester, U.K., 1994; p 468.
Kersting, R.; Pijpers, A.P.; Hagenhoff, B.; Verlaek, R.; Stapel, D.; Benninghoven, A.; Schwede, B.-C. In Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry; Benninghoven, A., Bertrand, P., Migeon, H.-N., Werner, H.W., Eds.; Elsevier Science B.V.: Amsterdam, 2000; p 825.
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