Article (Scientific journals)
Exploiting Electron Spectroscopies to Probe the Structure and Organization of Self-assembled Monolayers : a Review
Duwez, Anne-Sophie
2004In Journal of Electron Spectroscopy and Related Phenomena, 134, p. 97-138
Peer Reviewed verified by ORBi
 

Files


Full Text
JESRP2004_134_97.pdf
Publisher postprint (983.79 kB)
Request a copy

All documents in ORBi are protected by a user license.

Send to



Details



Keywords :
self-assembly; monolayers; XPS
Abstract :
[en] In this paper, we review and discuss the use of electron spectroscopies to characterize self-assembled monolayers (SAMs). The review concentrates on thiol-derived monolayers on gold with emphasis on n-alkanethiols, considered as archetypal systems. Since they are relatively simple model systems (ease of preparation, high structural order, and flexibility in the structure of chemical groups exposed to the surface), they are particularly well-suited reference samples for molecular level understanding of surface phenomena and for disclosing the potential of surface sensitive techniques. Some examples concerning silane-derived monolayers are also discussed. Many different spectroscopic techniques have been applied to characterize SAMs. Among them, electron spectroscopies, such as XPS, UPS, photoemission with synchrotron radiation, and HREELS, have been used to investigate the structure of alkanethiols on gold, and in particular, to characterize the S–Au bond, the packing density, the crystalline order, and molecular orientation.We try here to provide an overview on the structural information that can be obtained from those techniques. Damage processes induced by X-ray and electron beam are discussed in detail.
Disciplines :
Chemistry
Author, co-author :
Duwez, Anne-Sophie  ;  Université catholique de Louvain. Present address: University of Liège
Language :
English
Title :
Exploiting Electron Spectroscopies to Probe the Structure and Organization of Self-assembled Monolayers : a Review
Publication date :
2004
Journal title :
Journal of Electron Spectroscopy and Related Phenomena
ISSN :
0368-2048
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
134
Pages :
97-138
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 30 May 2010

Statistics


Number of views
83 (0 by ULiège)
Number of downloads
0 (0 by ULiège)

Scopus citations®
 
174
Scopus citations®
without self-citations
171
OpenCitations
 
168
OpenAlex citations
 
197

Bibliography


Similar publications



Contact ORBi