Development and application of high-resolution petrography on resin-impregnated Holocene peat columns to detect and analyse tephras, cryptotephras, and other materials

De Vleeschouwer, François; van Vliet-Lanoe, Brigitte; Fagel, Nathalie; Richter, Thomas; Boes, Xavier

doi:10.1016/j.quaint.2006.12.021

Reference : Development and application of high-resolution petrography on resin-impregnated Holoc...


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Multidisciplinary, general & others Physical, chemical, mathematical & earth Sciences : Earth sciences & physical geography
	To cite this reference:	http://hdl.handle.net/2268/37381

Title :	Development and application of high-resolution petrography on resin-impregnated Holocene peat columns to detect and analyse tephras, cryptotephras, and other materials
Language :	English
Author, co-author :	De Vleeschouwer, François [> > > >]
	van Vliet-Lanoe, Brigitte [> > > >]
	Fagel, Nathalie [Université de Liège - ULiège > Département de géologie > Argiles, géochimie et environnements sédimentaires >]
	Richter, Thomas [> > > >]
	Boes, Xavier [> > > >]
Publication date :	2008
Journal title :	Quaternary International
Publisher :	Pergamon Press - An Imprint of Elsevier Science
Volume :	178
Pages :	54-67
Peer reviewed :	Yes (verified by ORBi)
Audience :	International
ISSN :	1040-6182
City :	Oxford
Country :	United Kingdom
Keywords :	[en] tephra ; impregnation technique ; peatbog
Abstract :	[en] We describe the potential for high-resolution detection, observation and chemical analysis of tephras and cryptotephras in freeze-dried and resin-impregnated peat sections. Special attention is drawn to tephra grain alteration products, sensitive to standard lab treatment, but preserved using an impregnation technique developed here. Resulting blocks and thin sections provide a continuous archive of tephras that can be investigated through a wide range of non-destructive techniques encompassing polarising and fluorescence microscopy, scanning electron microscopy with/without elemental analysis, and XRF-based core scanning. (c) 2007 Elsevier Ltd and INQUA. All rights reserved.
Funders :	FRIA - Fonds pour la formation à la Recherche dans l'Industrie et dans l'Agriculture ; F.R.S.-FNRS - Fonds de la Recherche Scientifique
Target :	Researchers
Permalink :	http://hdl.handle.net/2268/37381
DOI :	10.1016/j.quaint.2006.12.021
Mentions required by the publisher for OA :	The authors thank Elsevier for their authorisation.

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