Operational monitoring of multi-qubit entanglement classes with trapped ions

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Poster (Scientific congresses and symposiums)

Bastin, Thierry; Thiel, C.; von Zanthier, J. et al.

2008 • Workshop "Modern applications of trapped ions"

Editorial reviewed

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https://hdl.handle.net/2268/36691

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Disciplines :

Physics

Author, co-author :

Bastin, Thierry ; Université de Liège - ULiège > Département de physique > Physique des atomes froids

Thiel, C.

von Zanthier, J.

Lamata, L.

Solano, E.

Agarwal, G. S.

Language :

English

Title :

Operational monitoring of multi-qubit entanglement classes with trapped ions

Publication date :

2008

Event name :

Workshop "Modern applications of trapped ions"

Event place :

Les Houches, France

Event date :

Mai 2008

Audience :

International

Peer reviewed :

Editorial reviewed

Available on ORBi :

since 17 May 2010

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