Alfaham, Abdallah ; Université de Liège - ULiège > Montefiore Institute of Electrical Engineering and Computer Science ; University of Antwerp-imec IDLab,Faculty of Applied Engineering,Antwerp,Belgium
Kocak, Murat; KU Leuven,Dept. Computer Science,Leuven,Belgium
Elmaz, Furkan; University of Antwerp-imec IDLab,Faculty of Applied Engineering,Antwerp,Belgium
Mitard, Jerome; imec,Leuven,Belgium
Vanderschrick, Joris; imec,Leuven,Belgium
Mets, Kevin; University of Antwerp-imec IDLab,Faculty of Applied Engineering,Antwerp,Belgium
Mercelis, Siegfried; University of Antwerp-imec IDLab,Faculty of Applied Engineering,Antwerp,Belgium
Language :
English
Title :
Advancing MOSFET Fault Type Detection Through Data-Driven Unsupervised Learning
Publication date :
14 October 2025
Event name :
IEEE IECON – 51st Annual Conference of the IEEE Industrial Electronics Society
Event place :
Madrid, Spain
Event date :
14-17 October 2025
By request :
Yes
Audience :
International
Main work title :
Advancing MOSFET Fault Type Detection Through Data-Driven Unsupervised Learning
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), Madrid, Unknown/unspecified
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