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Simultaneous partial discharge and current measurements in a needle-plane configuration at different pressures
Gillis, Thibault; Fagnard, Jean-François; Vanderbemden, Philippe
2025In Journal of Physics. Conference Series, 2952 (1), p. 012008
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Keywords :
Applied voltages; Discharge activities; Flash sintering; Measurement system; Needle-plane; Partial discharge activity; Phase resolved partial discharge measurement
Abstract :
[en] Phase-resolved partial discharge (PRPD) measurement has been used for decades as a method of monitoring defects in electrically insulating materials. More recently, it has seen a renewed interest in the context of flash sintering, a novel ceramic densification process where the sample to be densified is subjected to an electric field in addition to the usual application of heat. In the context of flash sintering, the monitoring of partial discharge (PD) activity has shown that this activity increases when approaching the onset of the thermal runaway phenomenon leading to the quick densification of the material, and is influenced by environmental factors such as relative humidity or pressure. A new microcontroller-based PRPD measurement system architecture has recently been proposed as a means to explore this PD activity in further details. While PDRD measurement is traditionally carried out by comparing the measured partial discharge pattern to the waveform of the voltage applied to the device under test (DUT), we show in this work that expanding this bespoke measurement system to be able to simultaneously monitor the waveform of the current going through the DUT allows for the collection of data related to the electrical power transferred to the DUT during the process that displays peculiar features. In the present work, the DUT consists of a classical needle-plane setup. As pressure decreases down from atmospheric levels, the threshold voltage leading up to the apparition of discharges decreases following a trend similar to the classical Paschen curve. Additionally, the nature of the discharge activity transitions from low-amplitude, rapid-firing tightly packed trains of pulses to high-amplitude, longer-lasting and more spread out pulses. Simultaneous measurement of the discharges, applied voltage and current going through the DUT shows that this second type of discharge activity can be synchronous with an asymmetric, distorted current waveform having the same period as the applied voltage, corresponding to a transfer of active electrical power into the DUT. Furthermore, the width of these current waveforms expands as the applied voltage is increased progressively starting from the threshold voltage for the activation of discharge activity, indicating that the rate of total power transferred in the DUT may be tuned using the amplitude of the applied voltage. External confirmation of a significant power transfer taking place in these conditions is obtained through the observation of damage inflicted on the DUT after a period of sustained discharge activity at low pressure.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Gillis, Thibault  ;  Université de Liège - ULiège > Montefiore Institute of Electrical Engineering and Computer Science
Fagnard, Jean-François  ;  Université de Liège - ULiège > Montefiore Institute of Electrical Engineering and Computer Science
Vanderbemden, Philippe  ;  Université de Liège - ULiège > Département d'électricité, électronique et informatique (Institut Montefiore) > Capteurs et systèmes de mesures électriques
Language :
English
Title :
Simultaneous partial discharge and current measurements in a needle-plane configuration at different pressures
Publication date :
2025
Event name :
23rd International School on Condensed Matter Physics "Recent Progress in Advanced Materials and Applications" (ISCMP 2024)
Event place :
Varna, Bulgaria
Event date :
26-08-2024 to 30-08-2024
By request :
Yes
Audience :
International
Journal title :
Journal of Physics. Conference Series
ISSN :
1742-6588
eISSN :
1742-6596
Publisher :
Institute of Physics Publishing (IOP)
Volume :
2952
Issue :
1
Pages :
012008
Peer review/Selection committee :
Peer Reviewed verified by ORBi
Available on ORBi :
since 05 July 2025

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