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How to mitigate and use the reduction process occurring in LSIMS/FAB
Agnello, Armélinda; De Pauw, Edwin; Natalis, Paul
1992In Advances in Mass Spectrometry, 12, p. 890
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Keywords :
Mass Spectrometry; LSIMS/FAB; MS/MS; Reduction process
Abstract :
[en] Reduction process is widely observed in LSIMS/FAB spectrometry when radical producing matrices are used. This phenomenom strongly alters the expected isotopic intensity distribution of the molecular ion. The extent of chemical damage depends on the solute concentration. On the other hand, it can be taken advantage of the reduction process because the oxidized and reduced molecular forms exhibit different fragmentation pattern. Helpful structural information can be infered from these MS/MS data.
Disciplines :
Chemistry
Author, co-author :
Agnello, Armélinda  ;  Université de Liège - ULiège > Département de chimie (sciences)
De Pauw, Edwin  ;  Université de Liège - ULiège > Département de chimie (sciences)
Natalis, Paul ;  Université de Liège - ULiège > > Section chimie
Language :
English
Title :
How to mitigate and use the reduction process occurring in LSIMS/FAB
Publication date :
1992
Event name :
12th International Mass Spectrometry Conference
Event date :
26-30 Août 1991
Audience :
International
Journal title :
Advances in Mass Spectrometry
ISSN :
0568-000X
Publisher :
Heyden & Son, London, United Kingdom
Volume :
12
Pages :
890
Peer review/Selection committee :
Peer reviewed
Funders :
FRIA - Fonds pour la Formation à la Recherche dans l'Industrie et dans l'Agriculture
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since 25 March 2025

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