Embargo Until 11/Jan/2028 - Author postprint (1.03 MB)
This is the Accepted Manuscript of the article "SVDD control charts based on MEWMA technique for monitoring compositional data", published by Elsevier in Computers & Industrial Engineering on January 11, 2025. The final article is available at https://doi.org/10.1016/j.cie.2025.110865.
This accepted manuscript is subject to an embargo period and will be available for open access on ORBi starting January 11, 2028, which is 36 months after its initial publication date of January 11, 2025.
Statistical process control; Compositional data; Control chart; Isometric log-ratio; Dirichlet density; Support vector data description
Abstract :
[en] Monitoring compositional data (CoDa) using control charts has become increasingly important in Statistical Process Control (SPC). This study introduces two approaches for CoDa monitoring, utilizing support vector data description (SVDD) control charts in conjunction with the multivariate exponentially weighted moving average (MEWMA) technique, specifically focusing on Phase II monitoring processes. The proposed approaches use two transformation methods: the Dirichlet density transformation and the isometric log-ratio transformation.
We evaluate the effectiveness of the proposed SVDD control charts by computing the out-of-control zero-state Average Run Length ($\ARL_1$) using simulated data. Our results demonstrate that SVDD control charts detect anomalies more effectively than the traditional MEWMA control chart across various scenarios in monitoring CoDa. These findings contribute to the advancement of SPC and offer valuable insights for practitioners involved in CoDa monitoring across diverse applications.
Research Center/Unit :
HEC Liège Research - ULiège
Disciplines :
Computer science
Author, co-author :
Nguyen, Thi Thuy Van ; Université de Liège - ULiège > HEC Liège : UER > UER Opérations
Heuchenne, Cédric ; Université de Liège - ULiège > HEC Liège : UER > UER Opérations : Statistique appliquée à la gestion et à l'économie
Tran, Kim Duc; Dong A University, Danang, Vietnam > IAD
Tartare, Guillaume; University of Lille, France > ENSAIT, ULR 2461 - GEMTEX - Génie et Matériaux Textiles
Tran, Kim Phuc; University of Lille, France > ENSAIT, ULR 2461 - GEMTEX - Génie et Matériaux Textiles
Language :
English
Title :
SVDD control charts based on MEWMA technique for monitoring Compositional Data
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