[en] Ubiquitous in most superconducting materials and a common result of nanofabrication processes, weak links are known for their limiting effects on the transport of electric currents. Still, they are at the root of key features of superconducting technology. By performing quantitative magneto-optical imaging experiments and thermomagnetic model simulations, we correlate the existence of local maxima in the magnetization loops of focused ion beam (FIB)-patterned Nb films to a magnetic field induced weak-to-strong-link transformation increasing their critical current. This phenomenon arises from the nanoscale interaction between quantized magnetic flux lines and FIB-induced modifications of the device microstructure. Under an ac drive field, this leads to a rectified vortex motion along the weak link. The reported tunable effect can be exploited in the development of new superconducting electronic devices, such as flux pumps and valves, to attenuate or amplify the supercurrent through a circuit element and as a strategy to enhance the critical current in weak-link-bearing devices.
Disciplines :
Physics
Author, co-author :
Chaves, Davi A. D. ; Departamento de Física, Universidade Federal de São Carlos, Brazil
Valerio-Cuadros, M.I.; Departamento de Física, Universidade Federal de São Carlos, Brazil ; Departamento de Física, Universidade Estadual de Maringá, Brazil
Jiang, L. ; School of Aeronautics, Northwestern Polytechnical University, Xi'an, China ; Experimental Physics of Nanostructured Materials, Q-MAT, CESAM, Université de Liège, Belgium
Abbey, E.A. ; Departamento de Física, Universidade Federal de São Carlos, Brazil
Colauto, F.; Departamento de Física, Universidade Federal de São Carlos, Brazil
Oliveira, A.A.M.; Instituto Federal de Educação Ciência e Tecnologia de São Paulo, Campus São Carlos, Brazil
De Andrade, A.M.H.; Instituto de Física, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
Pinheiro, L.B.L.G. ; Departamento de Física, Universidade Federal de São Carlos, Brazil ; Instituto Federal de Educação Ciência e Tecnologia de São Paulo, Campus São Carlos, Brazil
Johansen, T.H.; Department of Physics, University of Oslo, Oslo, Norway
Xue, C.; School of Mechanics Civil Engineering and Architecture, Northwestern Polytechnical University, Xi'an, China
Zhou, Y.-H.; School of Aeronautics, Northwestern Polytechnical University, Xi'an, China ; Department of Mechanics and Engineering Sciences, Lanzhou University, Key Laboratory of Mechanics on Disaster and Environment in Western China, Ministry of Education of China, Lanzhou, China
Silhanek, Alejandro ; Université de Liège - ULiège > Département de physique > Physique expérimentale des matériaux nanostructurés
Ortiz, W.A. ; Departamento de Física, Universidade Federal de São Carlos, Brazil
Motta, M. ; Departamento de Física, Universidade Federal de São Carlos, Brazil
CAPES - Coordenação de Aperfeicoamento de Pessoal de Nível Superior [BR] FAPESP - Fundação de Amparo à Pesquisa do Estado de São Paulo [BR] CNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico [BR] NSCF - National Natural Science Foundation of China [CN] CSC - China Scholarship Council [CN] LNNano - Laboratório Nacional de Nanotecnologia [BR]
Funding text :
This work was partially supported by Coordenação de Aperfeiçoamento de Pessoal de Nível Superior, Brazil (CAPES), Finance Code 001, the São Paulo Research Foundation (FAPESP, Grant No. 2021/08781-8), and the National Council for Scientific and Technological Development (CNPq, Grants No. 431974/2018-7, No. 316602/2021-3, and No. 309928/2018-4). C.X. acknowledges the support by the National Natural Science Foundation of China (Grants No. 11972298 and 12011530143). L.J. was supported by the China Scholarship Council. The authors thank the Laboratory of Structural Characterization (LCE/DEMa/UFSCar) for the EDS and AFM measurements. The research was supported by LNNano, Brazilian Nanotechnology National Laboratory (CNPEM/MCTI) during the use of the Device Manufacturing open access facility.
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See Supplemental Material at http://link.aps.org/supplemental/10.1103/PhysRevB.108.214502 to watch the full videos capturing the flux penetration into the samples.