[en] The polychromatic integral diffraction efficiency (PIDE) metric is generally used to select the most suitable materials for multilayer diffractive optical elements (MLDOEs). However, this method is based on the thin element approximation, which yields inaccurate results in the case of thick diffractive elements such as MLDOEs. We propose a new material selection approach, to the best of our knowledge, based on three metrics: transmission, total internal reflection, and the optical component’s total thickness. This approach, called “geometric optics material selection method” (GO-MSM), is tested in mid-wave and long-wave infrared bands. Finite-difference time-domain is used to study the optical performance (Strehl ratio) of the “optimal” MLDOE combinations obtained with the PIDE metric and the GO-MSM. Only the proposed method can provide MLDOE designs that perform. This study also shows that an MLDOE gap filled with a low index material (air) strongly degrades the image quality.
Research Center/Unit :
CSL - Centre Spatial de Liège - ULiège
Disciplines :
Physics
Author, co-author :
Laborde, Victor ; Université de Liège - ULiège > Unités de recherche interfacultaires > Space sciences, Technologies and Astrophysics Research (STAR)
Loicq, Jerôme ; Université de Liège - ULiège > Centres généraux > CSL (Centre Spatial de Liège) ; Delft University of Technology
Hastanin, Juriy ; Université de Liège - ULiège > Centres généraux > CSL (Centre Spatial de Liège)
Habraken, Serge ; Université de Liège - ULiège > Centres généraux > CSL (Centre Spatial de Liège)
Language :
English
Title :
Multilayer diffractive optical element material selection method based on transmission, total internal reflection, and thickness
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