Article (Scientific journals)
Grazing incidence X-ray reflectometry studies of CdTe(1 1 1) surfaces and a-Si thin films
Ijdiyaou, I.; Hafidi, K.; Azizan, M. et al.
1998In Solar Energy Materials and Solar Cells, 52, p. 27-36
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Abstract :
[en] Chemically treated cadmium telluride (CdTe) surfaces and amorphous silicon (a-Si) thin films were characterized by X-ray reflectometry at grazing incidence. In the case of the surface of CdTe single crystal treated with an oxidizing agent (a solution of Br2 in CH3OH), the superficial layer was found to be less dense than its support with a profound alteration of CdTe in the volume. After rinsing in KOH solution, the properties of single-crystalline CdTe are obtained. In the case of a-Si thin layers, we show that the simulation of the reflectometry curves enables not only the determination of the layer thickness but also the detection of an ultrathin superficial oxide layer.
Disciplines :
Physics
Author, co-author :
Ijdiyaou, I.
Hafidi, K.
Azizan, M.
Ameziane, E. L.
Outzourhit, A.
Dreesen, Laurent ;  Université de Liège - ULiège > Département de physique > Biophotonique
Benai, K.
Language :
English
Title :
Grazing incidence X-ray reflectometry studies of CdTe(1 1 1) surfaces and a-Si thin films
Publication date :
1998
Journal title :
Solar Energy Materials and Solar Cells
ISSN :
0927-0248
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
52
Pages :
27-36
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 26 October 2009

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