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Electronic speckle pattern interferometry
Slangen, Pierre; Renotte, Yvon; Lion, Yves
1993 • In Proceedings of the General Scientific Meeting of the Belgian Society of Physics, Bio-, Medical and Applied Physics, Leuven (Belgium), 27-28 May 1993
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https://hdl.handle.net/2268/263354
 

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Keywords :
Optical metrology; ESPI
Disciplines :
Physics
Author, co-author :
Slangen, Pierre;  Université de Liège - ULiège > Physique > Laboratoire de Physique générale
Renotte, Yvon  ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Lion, Yves ;  Université de Liège - ULiège > Physique > Laboratoire de Physique générale
Language :
French
Title :
Electronic speckle pattern interferometry
Publication date :
27 May 1993
Event name :
Meeting of the Belgian Society of Physics, Bio-, Medical and Applied Physics
Event organizer :
Belgian Society of Physics
Event place :
Leuven, Belgium
Event date :
27 et 28 mai 1993
Main work title :
Proceedings of the General Scientific Meeting of the Belgian Society of Physics, Bio-, Medical and Applied Physics, Leuven (Belgium), 27-28 May 1993
Pages :
paper n° AP.01, p.17
Available on ORBi :
since 13 September 2021

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