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Quantitative three-dimentional measurements of vibration amplitudes and phases as a function of frequency by digital speckle pattern interferometry
De Veuster, Christophe; Renotte, Yvon; Berwart, Léon et al.
2000In Gordon M. Brown (Ed.) Modern Interferometry - Selected SPIE Papers
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Keywords :
Optical metrology; Optical interferometry; ESPI
Disciplines :
Physics
Author, co-author :
De Veuster, Christophe;  Université de Liège - ULiège > Physique > HOLOLAB
Renotte, Yvon  ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Berwart, Léon;  Université de Liège - ULiège > Physique > HOLOLAB
Lion, Yves ;  Université de Liège - ULiège > Physique > Hololab
Language :
English
Title :
Quantitative three-dimentional measurements of vibration amplitudes and phases as a function of frequency by digital speckle pattern interferometry
Publication date :
August 2000
Main work title :
Modern Interferometry - Selected SPIE Papers
Author, co-author :
Gordon M. Brown
Publisher :
SPIE - International Society for Optical Engineering, Bellingham, United States
Collection name :
SPIE Electronic Publications, SPIE Vol CDP15
Pages :
322-333
Peer reviewed :
Peer reviewed
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