Caractérisation d’hologrammes de réflexion accolés

Renotte, Yvon; Lion, Yves; Habraken, Serge

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Caractérisation d’hologrammes de réflexion accolés

Renotte, Yvon; Lion, Yves; Habraken, Serge

1995 • In Opto 95, ESI Publications, Paris (1995)

Peer reviewed

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https://hdl.handle.net/2268/262813

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Keywords :

Holographic Optical Element; Holography; Composed elements

Abstract :

[fr] Caractérisation d’hologrammes de réflexion accolés: apport de la technique

Disciplines :

Physics

Author, co-author :

Renotte, Yvon ; Université de Liège - ULiège > Département de physique > Optique - Hololab

Lion, Yves ; Université de Liège - ULiège > Physique > HOLOLAB

Habraken, Serge ; Université de Liège - ULiège > Département de physique > Optique - Hololab

Language :

English

Title :

Caractérisation d’hologrammes de réflexion accolés

Publication date :

1995

Event name :

15th European Symposium on Optoelectronics

Event organizer :

EOS (European Optical Society)

Event place :

Paris, France

Event date :

28 au 30 mars 1995

Audience :

International

Main work title :

Opto 95, ESI Publications, Paris (1995)

Publisher :

EOS

Pages :

452-458

Peer reviewed :

Peer reviewed

Available on ORBi :

since 29 August 2021

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