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Computer-aided interferometric measurements of drift and phase shifter calibration for DSPI (Digital Speckle Pattern Interferometry)
Slangen, Pierre; De Veuster, Christophe; Renotte, Yvon et al.
1995In Optical Engineering: the Journal of the Society of Photo-Optical Instrumentation Engineers, 34, p. 3526-3530
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Keywords :
Optical metrology; Optical interferometry; ESPI
Abstract :
[en] Characterisation of an interferometric optical design for ESPI
Disciplines :
Physics
Author, co-author :
Slangen, Pierre;  Université de Liège - ULiège > Physique > HOLOLAB
De Veuster, Christophe;  Université de Liège - ULiège > Physique > HOLOLAB
Renotte, Yvon  ;  Université de Liège - ULiège > Département de physique > Optique - Hololab
Berwart, Léon;  Université de Liège - ULiège > Physique > HOLOLAB
Lion, Yves ;  Université de Liège - ULiège > Physique > HOLOLAB
Language :
English
Title :
Computer-aided interferometric measurements of drift and phase shifter calibration for DSPI (Digital Speckle Pattern Interferometry)
Publication date :
1995
Journal title :
Optical Engineering: the Journal of the Society of Photo-Optical Instrumentation Engineers
ISSN :
0091-3286
Publisher :
SPIE - International Society for Optical Engineering, United States - Washington
Volume :
34
Pages :
3526-3530
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
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