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The EUI flight instrument of Solar Orbiter: From optical alignment to end-to-end calibration
Halain, Jean-Philippe; Renotte, Etienne; Auchère, F. et al.
2018In Proceedings of SPIE: The International Society for Optical Engineering, 10699
 

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Keywords :
Calibration; Extreme Ultraviolet; Flight Model; Optical Alignment; Solar Orbiter; Alignment; Orbits; Space telescopes; Verification; Extreme ultraviolet imager; Flight models; On-ground calibration; Operating wavelength; Optical alignments; Solar Orbiters; Vacuum ultraviolets; Gamma rays
Abstract :
[en] The Extreme Ultraviolet Imager (EUI) instrument for the Solar Orbiter mission will image the solar corona in the extreme ultraviolet (17.1 nm and 30.4 nm) and in the vacuum ultraviolet (121.6 nm) spectral ranges. The development of the EUI instrument has been successfully completed with the optical alignment of its three channels' telescope, the thermal and mechanical environmental verification, the electrical and software validations, and an end-toend on-ground calibration of the two-units' flight instrument at the operating wavelengths. The instrument has been delivered and installed on the Solar Orbiter spacecraft, which is now undergoing all preparatory activities before launch. © 2018 SPIE.
Disciplines :
Space science, astronomy & astrophysics
Author, co-author :
Halain, Jean-Philippe ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Renotte, Etienne 
Auchère, F.;  Institut d'Astrophysique Spatiale, Orsay, France
Berghmans, D.;  Royal Observatory of Belgium, Brussels, Belgium
Delmotte, F.;  Laboratoire Charles Fabry, Institut D'Optique Graduate School, CNRS, Université Paris-Saclay, France
Harra, L.;  UCL-Mullard Space Science Laboratory, Surray, United Kingdom
Schmutz, W.;  Physikalisch-Meteorologisches Observatorium Davos, World Radiation Center, Switzerland
Schühle, U.;  Max-Planck-Institut für Sonnensystemforschung, Göttingen, Germany
Aznar Cuadrado, R.;  Max-Planck-Institut für Sonnensystemforschung, Göttingen, Germany
Dumesnil, C.;  Institut d'Astrophysique Spatiale, Orsay, France
Gyo, M.;  Physikalisch-Meteorologisches Observatorium Davos, World Radiation Center, Switzerland
Kennedy, T.;  UCL-Mullard Space Science Laboratory, Surray, United Kingdom
Verbeeck, C.;  Royal Observatory of Belgium, Brussels, Belgium
Barbay, J.;  Institut d'Astrophysique Spatiale, Orsay, France
Giordanengo, B.;  Royal Observatory of Belgium, Brussels, Belgium
Gissot, S.;  Royal Observatory of Belgium, Brussels, Belgium
Gottwald, A.;  Physikalisch-Technische Bundesanstalt, Berlin, Germany
Heerlein, K.;  Max-Planck-Institut für Sonnensystemforschung, Göttingen, Germany
Hellin, Marie-Laure ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Hermans, Aline ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Hervier, V.;  Institut d'Astrophysique Spatiale, Orsay, France
Jacques, Lionel  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Laubis, C.;  Physikalisch-Technische Bundesanstalt, Berlin, Germany
Mazzoli, Alexandra  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Meining, S.;  Max-Planck-Institut für Sonnensystemforschung, Göttingen, Germany
Mercier, R.;  Laboratoire Charles Fabry, Institut D'Optique Graduate School, CNRS, Université Paris-Saclay, France
Philippon, A.;  Institut d'Astrophysique Spatiale, Orsay, France
Roose, Stéphane  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Rossi, Laurence ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Scholze, F.;  Physikalisch-Technische Bundesanstalt, Berlin, Germany
Smith, Philip J.
Teriaca, L.;  Max-Planck-Institut für Sonnensystemforschung, Göttingen, Germany
Zhang, X.;  Institut d'Astrophysique Spatiale, Orsay, France
Rochus, Pierre  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
More authors (24 more) Less
Language :
English
Title :
The EUI flight instrument of Solar Orbiter: From optical alignment to end-to-end calibration
Publication date :
2018
Event name :
Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
Event place :
Austin, United States - Texas
Event date :
10 June 2018 through 15
Audience :
International
Journal title :
Proceedings of SPIE: The International Society for Optical Engineering
ISSN :
0277-786X
eISSN :
1996-756X
Publisher :
International Society for Optical Engineering, Bellingham, United States - Washington
Volume :
10699
Commentary :
9781510619517
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