Defect assessment of Mg-doped Cu2O thin films prepared by RF magnetron sputtering

Sliti, Naama; Resende, Joao; Ratz, Thomas; Nguyen, Ngoc Duy

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Defect assessment of Mg-doped Cu2O thin films prepared by RF magnetron sputtering

Sliti, Naama; Resende, Joao; Ratz, Thomas et al.

2020 • Defects 2020 Workshop

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https://hdl.handle.net/2268/249367

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Keywords :

Transparent conducting materials; Transparent conducting oxides; p-type semiconductor oxide

Research Center/Unit :

CESAM - Complex and Entangled Systems from Atoms to Materials - ULiège

Disciplines :

Physics

Author, co-author :

Sliti, Naama ; Université de Liège - ULiège > CESAM

Resende, Joao; Université Grenoble Alpes > LMGP

Ratz, Thomas ; Université de Liège - ULiège > Département de physique > Département de physique

Nguyen, Ngoc Duy ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Language :

English

Title :

Defect assessment of Mg-doped Cu2O thin films prepared by RF magnetron sputtering

Publication date :

April 2020

Event name :

Defects 2020 Workshop

Event organizer :

imec

Event place :

Leuven, Belgium

Event date :

du 13 au 15 octobre 2020

Audience :

International

Additional URL :

https://www.defects2020.org

Available on ORBi :

since 07 July 2020

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