Potentiality of secondary ion mass spectrometry for chemical, micron-size imaging of multiphase polymer materials

Thin deposited films of the diblock copolymer poly{methylmethacrylate-b-(2,perfluorohexyl-ethyl)acrylate} blended into a poly (methylmethacrylate) matrix were studied by Secondary Ion Mass Spectrometry. The molecular information contained in the negative spectrum and peaks ratio measurement identify the top surface as being saturated with fluorinated chains. A multiphase morphology was also revealed by ion microscopy. The potentiality of Secondary Ion Mass Spectrometry to provide chemical images of micron-sized phases in polymer materials is nicely demonstrated. © 1993 Springer-Verlag.