A Triple Integration Timing Scheme for SPAD Time of Flight Imaging Sensors in 130 nm CMOS

Single Photon Avalanche Diode (SPAD); Time-of-Flight (ToF); Time-to-Amplitude Conversion (TAC); Timing; Avalanche diodes; CMOS integrated circuits; Particle beams; Timing circuits; Capacitive discharges; Experimental validations; Single photon avalanche diode; Time of flight; Time-of-flight cameras; Time-of-flight imaging; Integration

Abstract :

[en] This paper presents a triple integration time-to-amplitude conversion (TAC) scheme for high resolution SPAD time of flight cameras. Two reference integrators are added to the conventional integration based TAC design, allowing the scheme to be resistant to PVT variation, common mode noise and capacitive discharge. An implementation in 130 nm CMOS is presented with experimental validation to show a significant improvement over the traditional single integration scheme. The measured performance shows that the triple integration interpolator has an INL, DNL and RMS jitter of 85.1 ps, 43 ps and 65 ps respectively. © 2018 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Morrison, D.; Department of Electrical and Computer Systems Engineering, Monash University, Australia

Kennedy, S.; Department of Electrical and Computer Systems Engineering, Monash University, Australia

Delic, D.; Defence Science Technology Group, Australia

Yuce, M.; Department of Electrical and Computer Systems Engineering, Monash University, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

A Triple Integration Timing Scheme for SPAD Time of Flight Imaging Sensors in 130 nm CMOS

Publication date :

2018

Event name :

25th IEEE International Conference on Electronics Circuits and Systems, ICECS 2018

Event date :

9 December 2018 through 12 December 2018

Audience :

International

Main work title :

Proceedings of IEEE International Conference on Electronics, Circuits and Systems

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Pages :

13-16

Peer reviewed :

Peer reviewed

Commentary :

144481 9781538695623

Available on ORBi :

since 06 September 2019

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Bibliography

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