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Shearography inspection of monolithic CFRP composites: finite element modeling approach for assessing an adequate strategy of artificial defects representing delamination
Vandenrijt, Jean-François; Xiong, Hu; Lequesne, Cédric et al.
2019In Proceedings of SPIE: The International Society for Optical Engineering, 11056
 

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Keywords :
Composites; Finite element methods; Inspection; Nondestructive evaluation; NDE; Nondestructive inspection; NDI; Shearography
Abstract :
[en] Delamination in carbon fiber reinforced polymer (CFRP) laminated composites is an important problem for industry. Nondestructive inspection (NDI) methods aim at locating such defects. Shearography is a full-field NDI method that could be considered to detect them. Reference plates for assessing performances of NDI methods for detecting delamination use artificial defects of several types introduced in reference CFRP matrices. Although they are standardized for usual ultrasound testing, these artifacts are not necessarily adequate for shearography. We have studied this problem by comparing shearography experiment and simulations by finite element analysis. We show the convergence with experiments on the case of flat bottom hole artifacts. Then we discuss the adequateness of other artifacts through simulations.
Research center :
CSL - Centre Spatial de Liège - ULiège
Disciplines :
Space science, astronomy & astrophysics
Author, co-author :
Vandenrijt, Jean-François  ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Xiong, Hu;  Siemens AG > Samtech SA
Lequesne, Cédric;  Siemens AG > Samtech SA
Blain, Pascal ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Georges, Marc ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Shearography inspection of monolithic CFRP composites: finite element modeling approach for assessing an adequate strategy of artificial defects representing delamination
Publication date :
21 June 2019
Event name :
SPIE Optical Metrology: Optical Measurement Systems for Industrial Inspection XI
Event organizer :
SPIE
Event place :
Munich, Germany
Event date :
June 24th - 27th, 2019
Audience :
International
Journal title :
Proceedings of SPIE: The International Society for Optical Engineering
ISSN :
0277-786X
eISSN :
1996-756X
Publisher :
International Society for Optical Engineering, Bellingham, United States - Washington
Special issue title :
Proceedings of SPIE
Volume :
11056
Name of the research project :
TECCOMA
Funders :
Service public de Wallonie Économie, Emploi, Recherche: Direction générale opérationnelle de l'économie, de l'emploi et de la recherche
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