Keywords :
Analog integrated circuit design; Bias current generators; CMOS processs; Current-steering D/A converter; Digital-to-analog converters; Electromagnetic compatibility (EMC); Electromagnetic susceptibilities; Fundamental design; Reference current generation; CMOS integrated circuits; Digital to analog conversion; Electromagnetic compatibility; Electromagnetic pulse; Electromagnetic wave interference; Linear integrated circuits; Magnetic susceptibility; Signal interference; Digital integrated circuits
Abstract :
[en] This paper describes the electromagnetic susceptibility of an 8 bit current steered thermometer encoded digital to analog converter (DAC) when electromagnetic interference (EMI) is injected into its bias current generator circuit. A theoretical analysis is presented and illustrates how the immunity to EMI can be increased by observing two fundamental design guidelines: these derivations are corroborated with simulations using the UMC 0.18 μm CMOS process. © 2011 Engineers Australia.
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