2DEGs at oxide interfaces : experimental facts

Gariglio, S.; Fête, A.; Li, D.; Stornaiuolo, D.; Cancellieri, C.; Caviglia, A.D.; Reyren, N.; Sacepe, B.; Morpurgo, A. F.; Gabay, M.; Fontaine, D.; Ghosez, Philippe; Reinle Schmitt, M.L.; Pauli, S.A.; Willmott, P.R.; Proust, C.; Piot, B.; Triscone, J.-M.

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2DEGs at oxide interfaces : experimental facts

Gariglio, S.; Fête, A.; Li, D. et al.

2012 • 20th International Conference on "High Magnetic Fields in Semiconductor Physics"

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https://hdl.handle.net/2268/237351

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Keywords :

2DEGs; oxide interfaces; experimental facts

Disciplines :

Physics

Author, co-author :

Gariglio, S.

Fête, A.

Li, D.

Stornaiuolo, D.

Cancellieri, C.

Caviglia, A.D.

Reyren, N.

Sacepe, B.

Morpurgo, A. F.

Gabay, M.

More authors (8 more)

Language :

English

Title :

2DEGs at oxide interfaces : experimental facts

Publication date :

27 July 2012

Event name :

20th International Conference on "High Magnetic Fields in Semiconductor Physics"

Event place :

Chamonix Mont-Blanc, France

Event date :

du 22 au 27 juillet 2012

By request :

Yes

Audience :

International

Available on ORBi :

since 24 June 2019

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