Structural Analysis of Orthorhombic Distortions in Perovskite Thin Films under Epitaxial Strain and Their Consequences on the Electronic Properties

Gariglio, S.; Meley, H.; de Bruijckere, J.; Alexander, D.; Karandeep; Ghosez, Philippe; Trisone, J.-M.

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Structural Analysis of Orthorhombic Distortions in Perovskite Thin Films under Epitaxial Strain and Their Consequences on the Electronic Properties

Gariglio, S.; Meley, H.; de Bruijckere, J. et al.

2018 • 2018 March Meeting of the American Physical Society

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https://hdl.handle.net/2268/237246

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Keywords :

orthorhombic distortion; thin perovskite film; expitaxial strain

Disciplines :

Physics

Author, co-author :

Gariglio, S.

Meley, H.

de Bruijckere, J.

Alexander, D.

Karandeep

Ghosez, Philippe ; Université de Liège - ULiège > Département de physique > Physique théorique des matériaux

Trisone, J.-M.

Language :

English

Title :

Structural Analysis of Orthorhombic Distortions in Perovskite Thin Films under Epitaxial Strain and Their Consequences on the Electronic Properties

Publication date :

09 March 2018

Event name :

2018 March Meeting of the American Physical Society

Event organizer :

the American Physical Society

Event place :

Los Angeles, United States

Event date :

du 05 au 09 mars 2018

Audience :

International

Available on ORBi :

since 24 June 2019

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