Critical thickness for ferroelectricity in perovskite ultrathin films

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Unpublished conference/Abstract (Scientific congresses and symposiums)

Ghosez, Philippe; Junquera, J.

2003 • 10th International Workshop on Oxide Electronics (WOE-10)

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Keywords :

thickness; ferroelectricity; ultrathin films

Disciplines :

Physics

Author, co-author :

Ghosez, Philippe ; Université de Liège - ULiège > Département de physique > Physique théorique des matériaux

Junquera, J.

Language :

English

Title :

Critical thickness for ferroelectricity in perovskite ultrathin films

Publication date :

13 September 2003

Event name :

10th International Workshop on Oxide Electronics (WOE-10)

Event place :

Augsburg, Germany

Event date :

du 11 au 13 septembre 2003

By request :

Yes

Audience :

International

Available on ORBi :

since 11 June 2019

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