Measurements of EMI susceptibility of precision voltage references

Richelli, A.; Colalongo, L.; Toninelli, L.; Rusu, I.; Redouté, Jean-Michel

doi:10.1109/EMCCompo.2017.7998103

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Paper published in a journal (Scientific congresses and symposiums)

Measurements of EMI susceptibility of precision voltage references

Richelli, A.; Colalongo, L.; Toninelli, L. et al.

2017 • In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, p. 162-167

Peer reviewed

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https://hdl.handle.net/2268/236425

DOI
10.1109/EMCCompo.2017.7998103

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Keywords :

Electromagnetic immunity; Electromagnetic compatibility; Electromagnetic pulse; Mixed signal integrated circuits; Voltage measurement; Capacitively coupled; Power supply line; Power-supply rails; Precision-voltage reference; Printed circuit boards (PCB); Voltage reference; Printed circuit boards

Abstract :

[en] This paper investigates and reports on the susceptibility of commercial voltage references to electromagnetic interference (EMI). Two separate scenarios have been considered. In the first experiment, the interferences are directly injected onto the power supply lines of each voltage reference. In the second measurement, EMI is capacitively coupled to all the pins of the voltage reference under test, including the output, hereby emulating the presence of a neighbouring noisy printed circuit board (PCB) trace. These measurements show that the resulting EMI-induced offset can attain considerable values at critical EMI frequencies, ranging from 30MHz to 100MHz when the EMI is injected into the power supply rails, and 300MHz to 500MHz when EMI is capacitively coupled to all the pins. © 2017 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Richelli, A.; Department of Information Engineering, University of Brescia, Italy

Colalongo, L.; Department of Information Engineering, University of Brescia, Italy

Toninelli, L.; Department of Information Engineering, University of Brescia, Italy

Rusu, I.; Department of Information Engineering, University of Brescia, Italy

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Measurements of EMI susceptibility of precision voltage references

Publication date :

2017

Event name :

11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017

Event date :

4 July 2017 through 8 July 2017

Audience :

International

Journal title :

Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Pages :

162-167

Peer reviewed :

Peer reviewed

Commentary :

129737 9781538626894

Available on ORBi :

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Bibliography

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