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A robust CMOS Miller OpAmp with High EMI-immunity
Boyapati, S.; Redouté, Jean-Michel; Baghini, M. S.
2017In 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
Peer reviewed
 

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Keywords :
CMOS; Electromagnetic interference immunity; Modified replica miller OpAmp; Operational amplifiers with high EMI immunity; Output offset voltage; Source-buffered Miller OpAmp with source degeneration resistance; CMOS integrated circuits; Electromagnetic compatibility; Electromagnetic pulse; Electromagnetic wave interference; Signal interference; Maximum output; Miller operational amplifiers; Offset voltage; Operating condition; Source degeneration; Operational amplifiers
Abstract :
[en] This paper presents a robust CMOS Miller operational amplifier (OpAmp) that has high immunity to electromagnetic interference (EMI). The proposed robust CMOS Miller operational amplifier uses the modified replica Miller OpAmp concept with the source-buffered Miller OpAmp with source degeneration resistance in order to achieve high EMI immunity across a wide range of frequencies (10 MHz to 1 GHz). Simulation results show that the maximum EMI-induced input offset voltage for the proposed robust CMOS Miller OpAmp is less than 5mV over a wide range of frequencies (10 MHz to 1GHz) when a 1 Vpp EMI signal is injected into the non-inverting input. In contrast, the classic Miller OpAmp generates a maximum output offset voltage of 216 mV at 1GHz under the same operating conditions. © 2017 IEEE.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Boyapati, S.;  IITB-Monash Research Academy, Indian Institute of Technology, Bombay, India
Redouté, Jean-Michel  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Baghini, M. S.;  Dept. of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India
Language :
English
Title :
A robust CMOS Miller OpAmp with High EMI-immunity
Publication date :
2017
Event name :
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC Europe 2017
Event date :
4 September 2017 through 8 September 2017
Audience :
International
Main work title :
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
Publisher :
Institute of Electrical and Electronics Engineers Inc.
Peer reviewed :
Peer reviewed
Commentary :
9781538606896
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