Susceptibility of flash ADCs to electromagnetic interference

ADC immunity measurement; Device reliability; DPI method; IEC 62132; Immunity; Bioelectric phenomena; Electromagnetic pulse; Electromagnetic wave interference; Signal interference; Immunity measurement; Analog to digital conversion

Abstract :

[en] Integrated devices acquiring environmental, industrial or biomedical signals are ubiquitous and require sensor systems to be situated in electromagnetically hostile environments and continue to operate reliably. The susceptibility to injected electromagnetic interference by an 8-bit flash Analog to Digital Converter (ADC) was measured using the direct power injection method (IEC 62132-4). The analysis of the immunity results and the susceptibility of the internal structure of the device are presented. Measurements show that the supply port is immune to interference but the analog input and reference voltage input ports are quite susceptible. Better understanding of the susceptibility of a flash ADC to EMI enables designers to reduce the cost of preventative measures implemented at the system level and improve the reliability of sensor systems. © 2017 Elsevier Ltd

Disciplines :

Electrical & electronics engineering

Author, co-author :

Kennedy, S.; Dept. of Electrical and Computer Systems Eng., Monash University, Melbourne, Australia

Yuce, M. R.; Dept. of Electrical and Computer Systems Eng., Monash University, Melbourne, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Susceptibility of flash ADCs to electromagnetic interference

Publication date :

2018

Journal title :

Microelectronics Reliability

ISSN :

0026-2714

Publisher :

Elsevier Ltd

Volume :

Pages :

218-225

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 15 November 2018

Statistics

Number of views

53 (0 by ULiège)

Number of downloads

0 (0 by ULiège)

More statistics

Scopus citations^®

Scopus citations^®
without self-citations

OpenCitations

Bibliography

Fiori, F., A sensor signal amplifier resilient to EMI. IEEE, Sensors 16:18 (2016), 7008–7015 18 Sept.
Ayed, A., Dubois, T., Levant, J.-L., Duchamp, G., Immunity measurement and modeling of an ADC embedded in a microcontroller using RFIP technique. IEEE Trans. Electromagn. Compat 57:5 (2015), 955–962 May.
Redouté, J., Steyaert, M., EMC of Analog Integrated Circuits. 2010, Springer, New York, NY USA.
Kennedy, S., Yuce, M., Redouté, J., Evaluation of conducted emission test methods for charge pump DC/DC converters. IEEE, Trans. Rel 66:1 (2016), 170–177 19 Dec.
Ben Dhia, S., Ramdani, M., Electromagnetic Compatibility of Integrated Circuits. 2006, Springer, New York, NY USA.
M. Quilez, O. Casas, R. Pallas-Areny, Susceptibility of Dual-Slope ADCs to Electromagnetic Interference: an Experimental Analysis 2007, 1-3 May.
Integrated circuits - measurement of electromagnetic immunity, 150khz to 1 GHz - part 5: direct RF power injection method IEC 62132-4 ed1, 2006.
Integrated circuits - measurement of electromagnetic immunity, 150khz to 1 GHz - part 1: General conditions and definitions IEC 62132-1 ed1, 2006.
Texas Instruments (2013). ADC0820-N 8-bit high speed /mup compatible a/d converter with track/hold function, [Online]. Available: http://www.ti.com/lit/gpn/adc0820-n, Accessed on: Jan. 10, 2016.
Fiori, F., Susceptibility of CMOS voltage comparators to radio frequency interference. IEEE, Trans. Electromagn. Compat 54:2 (2012), 434–442 April.
Crovetti, P., Fiori, F., RFI-induced distortion in switched-capacitor circuits. IEEE, Trans. Circuits Syst. I, Reg. Papers 53:4 (2006), 784–794 April.
Bronckers, S., Scheir, K., Van dar Plas, G., Vandersteen, G., Rolain, Y., A methodology to predict the impact of substrate noise in analog/RF systems. IEEE Trans. Comput.-Aided Design Integr. Circuits Syst. 28:11 (2009), 1613–1626 Nov.
Stefanou, A., Gielen, G., A Volterra series nonlinear model of the sampling distortion in flash ADCs due to substrate noise coupling. IEEE, Trans. Circuits Syst. II, Exp Briefs. 28:11 (2011), 1613–1626 Dec.
Singh, R., Sali, S., Modeling of electromagnetically coupled substrate noise in FLASH A/D converters. IEEE, Trans. Electromagn. Compat 45:2 (2003), 459–468 May.
T. Aurand, J. Dawson, M. Robinson, A. Marvin, Applying IEC 62132-2 to the real world: Immunity of an Analogue to Digital Converter, 2008, 8-12 Sept.