An integrated LVDS transmitter in 0.18-μm CMOS technology with high immunity to EMI

Analog integrated circuits; CMOS integrated circuits; Amplification; Analog circuits; Electromagnetic pulse; Electromagnetic wave interference; Integrated circuits; Interference suppression; Signal interference; Transmitters; Closed loop gain; CMOS technology; Common mode feedback; Independent driving; Low voltage differential signaling; LVDS transmitters; On-chip designs; Transverse electromagnetic cell

Abstract :

[en] This paper presents an on-chip design topology that compensates the effects of electromagnetic interference (EMI) in a low-voltage differential signaling (LVDS) transmitter. The proposed structure enables the transmitter to maintain a wide differential opening by achieving a superior common-mode level independent driving current and common-mode feedback closed-loop gain. Direct power injection measurements illustrate that the proposed LVDS transmitter structure demonstrates a superior EMI immunity as it maintains an eye opening of at least 100 mVp-p in presence of a conductive EMI injection ranging from 150 to 2 GHz with an amplitude of up to 9 Vp-p. Additionally, transverse electromagnetic cell measurements validate the radiated immunity of the proposed integrated LVDS transmitter in presence of an EMI injection of 30 dBm (150 kHz-2 GHz). This EMI robust LVDS transmitter was designed using the UMC 0.18-μm CMOS process. © 1964-2012 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Matig-a, G. A.; Department of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC 3800, Australia

Yuce, M. R.; Department of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC 3800, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

An integrated LVDS transmitter in 0.18-μm CMOS technology with high immunity to EMI

Publication date :

2015

Journal title :

IEEE Transactions on Electromagnetic Compatibility

ISSN :

0018-9375

eISSN :

1558-187X

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

128-134

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 25 September 2018

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