High-resolution passive phase shifters for adaptive duplexing applications in SOS process

Adaptive duplexing; Field effect transistors; Passive networks; Systems engineering; Auto-transformers; Duplexing; High resolution; Intercept points; Lumped element; Passive delay lines; Power-handling capability; Silicon-on-sapphire; Phase shifters

Abstract :

[en] Two high-resolution passive delay line phase shifters in silicon-on-sapphire are compared. Both make use of digitally tuned capacitor loaded π sections to obtain 360° phase control. The first has a nominal resolution of 9-bit and uses ten sections, yielding an insertion loss (IL) of 12.6 dB at 1.4 GHz. The second employs a center tapped auto-transformer to provide 180° of phase shift, reducing both size and the IL while enabling a further 1-bit improvement in resolution. The measured IL in the 1.8-2.4-GHz frequency range is less than 7.3 dB. Stacked field-effect transistors were employed as switches to increase the power-handling capability. An input referred third intercept point (IIP3) of + 39 and + 54 dBm were measured for the first and second circuits, respectively. © 2014 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Amirkhanzadeh, R.; College of Engineering and Science, Victoria University, Melbourne, VIC 8001, Australia

Sjöland, H.; Department of Electrical and Information Technology, Lund University, SE-221 00 Lund, Sweden

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Nobbe, D.; Peregrine Semiconductor Corporation, Chicago, IL 60004, United States

Faulkner, M.; College of Engineering and Science, Victoria University, Melbourne, VIC 8001, Australia

Language :

English

Title :

High-resolution passive phase shifters for adaptive duplexing applications in SOS process

Publication date :

2014

Journal title :

IEEE Transactions on Microwave Theory and Techniques

ISSN :

0018-9480

eISSN :

1557-9670

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

1678-1685

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 25 September 2018

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