Evaluation of conducted emission test methods for charge pump DC/DC converters

Charge pump circuits; Charge pump; Conducted emissions; Electromagnetic environments; Electronic systems; Frequency performance; Line impedance stabilization networks; Transverse electromagnetic cell; DC-DC converters

Abstract :

[en] This paper presents conducted emission measurements for a group of commercially available capacitive step-up dc/dc converters. A comparison of the traditional line impedance stabilization network conducted emission method with integrated circuit test methods including Ω, direct and transverse electromagnetic cell methods is presented. The frequency performance and systematic offsets of each method are examined. Relative electromagnetic compatibility of these devices is compared and correlation of results of different methods explored. Improved understanding of the electromagnetic environment improves the potential reliability of electronic systems. © 1963-2012 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Kennedy, S.; Department of Electrical and Computer Systems Engineering, Monash University, Clayton, 3800, Australia

Yuce, M. R.; Department of Electrical and Computer Systems Engineering, Monash University, Clayton, 3800, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Evaluation of conducted emission test methods for charge pump DC/DC converters

Publication date :

2017

Journal title :

IEEE Transactions on Reliability

eISSN :

0018-9529

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

170-177

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 11 September 2018

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Bibliography

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