Design of an EMI self-immune VML transmitter in 0.18-μ m CMOS

Direct power injection (DPI); CMOS integrated circuits; Electromagnetic pulse; Integrated circuit design; Eye heights; Eye openings; Integrated voltage; Open eye diagrams; Power injection; Self-immunity; Standard CMOS process; Transmitters

Abstract :

[en] This letter discusses an integrated voltage-mode logic (VML) transmitter demonstrating a superior self-immunity to electromagnetic interference (EMI). Both the proposed and typical transmitters were fabricated in the UMC 0.18- μm standard CMOS process. Using direct power injection measurement, the typical and proposed VML transmitters were subjected to EMI frequencies ranging from 100 kHz to 2 GHz and amplitudes up to 5-V peak. The proposed VML transmitter maintains an open eye diagram with a minimum eye height of 80 mV at the highest EMI amplitude, whereas the typical VML transmitter's eye opening completely closes for EMI frequencies from 700 kHz to 300 MHz and for EMI amplitudes exceeding 1.5-V peak. © 1964-2012 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Matig-A, G. E.; Department of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC 3800, Australia

Yuce, M. R.; Department of Electrical and Computer Systems Engineering, Monash University, Melbourne, VIC 3800, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

Design of an EMI self-immune VML transmitter in 0.18-μ m CMOS

Publication date :

2017

Journal title :

IEEE Transactions on Electromagnetic Compatibility

ISSN :

0018-9375

eISSN :

1558-187X

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Volume :

Issue :

Pages :

1646-1649

Peer reviewed :

Peer Reviewed verified by ORBi

Available on ORBi :

since 11 September 2018

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Bibliography

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