Structural analysis of LaVO3 thin films under epitaxial strain

Calculations; Crystal symmetry; High resolution transmission electron microscopy; Lanthanum compounds; Orbits; Perovskite; Rare earths; Scanning electron microscopy; Thin films; Transmission electron microscopy; X ray diffraction; Ab initio calculations; Octahedral rotations; Pattern orientation; Rare earth vanadates; Scanning transmission electron microscopy; Structural distortions; Temperature behavior; Thin-film structure; Vanadium compounds

Abstract :

[en] Rare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 for LaVO3) and the smaller one comes from inter-site d-orbital interactions manifesting as a cooperative Jahn-Teller effect. Epitaxial strain acts on octahedral rotations and crystal field symmetry to alter this complex lattice-orbit coupling. In this study, LaVO3 thin film structures have been investigated by X-ray diffraction and scanning transmission electron microscopy. The analysis shows two different orientations of octahedral tilt patterns, as well as two distinct temperature behaviors, for compressive and tensile film strain states. Ab initio calculations capture the strain effect on the tilt pattern orientation in agreement with experimental data. © 2018 Author(s).

Research center :

CESAM - Complex and Entangled Systems from Atoms to Materials - ULiège

Disciplines :

Physics

Author, co-author :

Meley, H.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland

Karandeep; Université de Liège - ULiège > Physique > Physique Théorique des Matériaux

Oberson, L.; Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

De Bruijckere, J.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland

Alexander, D. T. L.; Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

Triscone, J.-M.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland

Ghosez, Philippe ; Université de Liège - ULiège > Département de physique > Physique théorique des matériaux

Gariglio, S.; DQMP, University of Geneva, 24 Quai E.-Ansermet, Geneva, Switzerland, Delft University of Technology, Lorentzweg 1, Delft CJ, Netherlands

Language :

English

Title :

Structural analysis of LaVO3 thin films under epitaxial strain

Publication date :

2018

Journal title :

APL Materials

ISSN :

2166-532X

Publisher :

American Institute of Physics Inc.

Volume :

Pages :

046102

Peer reviewed :

Peer Reviewed verified by ORBi

Tags :

Tier-1 supercomputer
CÉCI : Consortium des Équipements de Calcul Intensif

Funders :

F.R.S.-FNRS - Fonds de la Recherche Scientifique [BE]
ARC

Available on ORBi :

since 24 June 2018

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