Reference : An overview of interferometric metrology and NDT techniques and applications for the ...
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/205147
An overview of interferometric metrology and NDT techniques and applications for the aerospace industry
English
Georges, Marc mailto [Université de Liège > > CSL (Centre Spatial de Liège) >]
Thizy, Cédric mailto [Université de Liège > > CSL (Centre Spatial de Liège) >]
Languy, Fabian mailto [Université de Liège > > CSL (Centre Spatial de Liège) >]
Vandenrijt, Jean-François mailto [Université de Liège > > CSL (Centre Spatial de Liège) >]
Aug-2016
Interferometry XVIII
SPIE
Proceedings of SPIE, Vol. 9960
996007
No
Yes
International
Bellingham
USA
Interferometry XVIII
Aug 30 - Sep 1, 2016
SPIE
San Diego
USA
[en] Nondestructive testing ; Optical metrology ; Aerospace industry ; Holography ; Thermography
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/205147
10.1117/12.2240676
http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2547471

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