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An overview of interferometric metrology and NDT techniques and applications for the aerospace industry
Georges, Marc; Thizy, Cédric; Languy, Fabian et al.
2016In Interferometry XVIII
Peer reviewed
 

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Keywords :
Nondestructive testing; Optical metrology; Aerospace industry; Holography; Thermography
Disciplines :
Physics
Author, co-author :
Georges, Marc ;  Université de Liège > CSL (Centre Spatial de Liège)
Thizy, Cédric ;  Université de Liège > CSL (Centre Spatial de Liège)
Languy, Fabian ;  Université de Liège > CSL (Centre Spatial de Liège)
Vandenrijt, Jean-François  ;  Université de Liège > CSL (Centre Spatial de Liège)
Language :
English
Title :
An overview of interferometric metrology and NDT techniques and applications for the aerospace industry
Publication date :
August 2016
Event name :
Interferometry XVIII
Event organizer :
SPIE
Event place :
San Diego, United States
Event date :
Aug 30 - Sep 1, 2016
By request :
Yes
Audience :
International
Main work title :
Interferometry XVIII
Publisher :
SPIE, Bellingham, United States
Collection name :
Proceedings of SPIE, Vol. 9960
Pages :
996007
Peer reviewed :
Peer reviewed
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