Photorefractives for holographic interferometry and nondestructive testing

[en] Thanks to its high sensitivity to displacement, holography is very well suited for metrology. In the case of holographic interferometry (HI), interference occurs between the object wavefront and a wavefront reconstructed by a hologram allowing a comparison between different objects, or different states of the same object. This chapter first discusses the importance of HI compared to other techniques such as electronic or computer based interferometry, then the author is developing various methodologies for holographic metrology, including real time, double exposure, and time averaged HI. Material considerations are covered and the specific case of photorefractive polymer and crystals are analyzed. Several experiments of nondestructive testing on industrial systems are discussed with measurement configurations relevant for thermal analysis, vibration, defect detection, and even historic artifact investigation.

Disciplines :

Physics

Author, co-author :

Georges, Marc ; Université de Liège > CSL (Centre Spatial de Liège)

Language :

English

Title :

Photorefractives for holographic interferometry and nondestructive testing

Publication date :

2016

Main work title :

Photorefractive Organic Materials and Applications

Author, co-author :

Blanche, Pierre-Alexandre

Publisher :

Springer

ISBN/EAN :

978-3-319-29332-5

Collection name :

Springer Series in Materials Science, vol 240

Pages :

283-312

Peer reviewed :

Peer reviewed

Available on ORBi :

since 20 July 2016

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