Current crowding; Superconductivity; microstructured
Abstract :
[en] Many applications of modern electronic devices are based on thin film geometries including sharp turns, holes and exhibiting inhomogeneities. The inevitable detour of current streamlines around such obstacles cause an inhomogeneous current density profile giving rise to current crowding. The goal of my research is to highlight the current crowding effects in micro and nanopatterned superconducting films.
Disciplines :
Physics
Author, co-author :
Adami, Obaïd-Allah ; Université de Liège > Département de physique > Département de physique
Language :
English
Title :
Electric current crowding effects in microstructured superconductors