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[en] This paper presents a sol-gel technological process for preparing thin films of ZnO and ZnO:Al. The effect of annealing treatments (500, 600, 700 and 800 oC) on their properties was studied. The structural evolution with the temperature was investigated by using X-Ray diffraction (XRD). Fourier Transform Infrared (FTIR) and UV-VIS spectrophotometry were applied to characterizing the films’ vibrational and optical properties. The ZnO and ZnO:Al films possessed a polycrystalline structure. The films studied are highly transparent in the visible spectral range. The optical band gap values and the haze parameter were also determined.
Disciplines :
Physics Chemistry
Author, co-author :
Ivanova, T; Bulgarian Academy of Sciences > 1Central Laboratory of Solar Energy and New Energy Sources
Harizanova, A; Bulgarian Academy of Sciences > Central Laboratory of Solar Energy and New Energy Sources
Koutzarova, T; Bulgarian Academy of Sciences > Institute of Electronics
Vertruyen, Bénédicte ; Université de Liège > Département de chimie (sciences) > Chimie inorganique structurale
Language :
English
Title :
Optical characterization of Sol-Gel ZnO:Al thin films
Publication date :
2016
Event name :
19th International Summer School on Vacuum, Electron and Ion Technologies (VEIT2015)
