No full text
Paper published in a book (Scientific congresses and symposiums)
Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults ?
Gaura, E.; Kraft, Michael
2002In Proc. of the 41st SICE Annual Conference (SICE 2002)
Peer reviewed
 

Files


Full Text
No document available.

Send to



Details



Disciplines :
Electrical & electronics engineering
Author, co-author :
Gaura, E.
Kraft, Michael ;  Université de Liège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Language :
English
Title :
Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults ?
Publication date :
August 2002
Event name :
Proc. of the 41st SICE Annual Conference (SICE 2002)
Event place :
Osaka, Japan
Event date :
Août 2002
By request :
Yes
Audience :
International
Main work title :
Proc. of the 41st SICE Annual Conference (SICE 2002)
Pages :
Vol. 3, pp. 2052-2057
Peer reviewed :
Peer reviewed
Available on ORBi :
since 09 November 2015

Statistics


Number of views
27 (1 by ULiège)
Number of downloads
0 (0 by ULiège)

Bibliography


Similar publications



Contact ORBi