Article (Scientific journals)
Laser Induced Magnetization Reversal for Detection in Optical Interconnects
Al Azim, Z.; Xuanyao, Fong; Ostler, Thomas et al.
2014In IEEE Electron Device Letters, 35 (12), p. 1317-1319
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Keywords :
Thermally Induced Magnetization Switching; Optical Interconnects
Disciplines :
Electrical & electronics engineering
Author, co-author :
Al Azim, Z.
Xuanyao, Fong
Ostler, Thomas ;  Université de Liège > Département de physique > Physique des matériaux et nanostructures
Chantrell, R.
Roy, K.
Language :
English
Title :
Laser Induced Magnetization Reversal for Detection in Optical Interconnects
Publication date :
2014
Journal title :
IEEE Electron Device Letters
ISSN :
0741-3106
eISSN :
1558-0563
Publisher :
Institute of Electrical and Electronics Engineers, New-York, United States - New York
Volume :
35
Issue :
12
Pages :
1317-1319
Peer reviewed :
Peer Reviewed verified by ORBi
European Projects :
FP7 - 281043 - FEMTOSPIN - Multiscale Modelling of Femtosecond Spin Dynamics
Funders :
CE - Commission Européenne [BE]
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