Paper published in a book (Scientific congresses and symposiums)
Combination of temporal phase unwrapping and long-wave infrared digital holographic interferometry for metrology of mosaic detector under space simulated conditions
digital holography; interferometry; CO2 laser; microbolometer array; long-wave infrared
Abstract :
[en] We present digital holographic interferometry (DHI) in the long-wave infrared for monitoring the deformation under cryogenic conditions of a segmented focal plane array to be used in a space mission. The long wavelength was chosen for its ability to allow measurement of displacements 20 times larger than DHI in the visible and which were foreseen with the test object under such temperature changes. The specimen consists of 4x4 mosaic of detectors assembled on a frame. It was required to assess the global deformation of the ensemble, the deformation of each detector, and piston movements of each of them with respect to their neighbors. For that reason we incorporated the temporal phase unwrapping by capturing a sufficiently high number of holograms between which the phase does not suffer strong variations. At last since the specimen exhibit specular reflectivity at that wavelength, it is illuminated through a reflective diffuser
Thizy, Cédric ; Université de Liège > CSL (Centre Spatial de Liège)
Beaumont, Florent; Laboratoire d’Astrophysique de Marseille
Garcia, José; Laboratoire d’Astrophysique de Marseille
Martin, Laurent; Laboratoire d’Astrophysique de Marseille
Fabron, Christophe; Laboratoire d’Astrophysique de Marseille
Prieto, Eric; Laboratoire d’Astrophysique de Marseille
Maciaszek, Thierry; Laboratoire d’Astrophysique de Marseille
Georges, Marc ; Université de Liège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Combination of temporal phase unwrapping and long-wave infrared digital holographic interferometry for metrology of mosaic detector under space simulated conditions
Publication date :
August 2015
Event name :
SPECKLE 2015: VI International Conference on Speckle Metrology
Event organizer :
Centro de Investigaciones en Optica
Event place :
Guanajuato, Mexico
Event date :
24-26 Aug 2015
Audience :
International
Main work title :
SPECKLE 2015: VI International Conference on Speckle Metrology
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