Article (Scientific journals)
Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry
Zemmamouche, Redouane; Vandenrijt, Jean-François; Medjahed, Aïcha et al.
2015In Optical Engineering: the Journal of the Society of Photo-Optical Instrumentation Engineers, 54 (8), p. 084110
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Keywords :
digital speckle photography; speckle interferometry; electronic speckle pattern interferometry; correlation
Abstract :
[en] Electronic speckle pattern interferometry (ESPI) is combined with digital speckle photography (DSP) to measure out-of-plane deformation in the presence of large in-plane translation or rotation. ESPI is used to measure out-of-plane displacements smaller than the speckle diameter. In-plane displacements larger than the speckle size are obtained by DSP using artifacts images computed from the phase-stepped specklegrams. Previous works use the specklegram modulation for that purpose, but we show that this can lead to errors in the case of low modulation. In order to avoid this, a simple averaging of phase-stepped specklegrams allows obtaining the average irradiance, which contains information on the speckled object image. The latter can be used more efficiently than the modulation in DSP and is simpler to compute. We also perform a numerical simulation of specklegrams, which show that the use of background terms is much more stable against some error sources as compared to modulation. We show experimental evidence of this in various experiments combining out-of-plane ESPI measurements with in-plane translations or rotations obtained by our DSP method. The latter has been used efficiently to restore phase loss in out-of-plane ESPI measurements due to large in-plane displacements.
Disciplines :
Physics
Author, co-author :
Zemmamouche, Redouane;  Université Ferhat Abbas, Sétif1 > Institut d'Optique et Mécanique de Précision > Laboratoire d'Optique Appliquée
Vandenrijt, Jean-François  ;  Université de Liège > CSL (Centre Spatial de Liège)
Medjahed, Aïcha;  Université Ferhat Abbas, Sétif1 > Institut d'Optique et Mécanique de Précision > Laboratoire d'Optique Appliquée
De Oliveira, Ivan;  Universidade Estadual de Campinas (UNICAMP) > Faculdade de Tecnologia/FT
Georges, Marc ;  Université de Liège > CSL (Centre Spatial de Liège)
Language :
English
Title :
Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry
Publication date :
August 2015
Journal title :
Optical Engineering: the Journal of the Society of Photo-Optical Instrumentation Engineers
ISSN :
0091-3286
Publisher :
International Society of Optical Engineering, Bellingham, United States - Washington
Volume :
54
Issue :
8
Pages :
084110
Peer reviewed :
Peer Reviewed verified by ORBi
Funders :
Ministry of Higher Education and Scientific Research of Algeria
University of M’SILA
the Institut National d’Optique et Mécanique de Precision of Sétif University
FAPESP - Fundação de Amparo à Pesquisa do Estado de São Paulo [BR]
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