[en] The thickness and roughness of polyacrylonitrile films electrografted on a nickel surface have been measured by ellipsometry, atomic force microscopy and X-ray reflectivity. From combined ellipsometry and X-ray reflectivity measurements, accurate values for the refractive indices of polyacrylonitrile and nickel have been derived at a 6328-Åwavelength. Dependence of the film thickness on the monomer concentration has been quantified for the first time. Furthermore, the thickness of the polyacrylonitrile (PAN) film is related to the nature of the solvent, depending on whether it is a good solvent for PAN (dimethylformamide; DMF) or not (acetonitrile; ACN).
Research Center/Unit :
Center for Education and Research on Macromolecules (CERM)
Disciplines :
Chemistry Materials science & engineering
Author, co-author :
Calberg, Cédric ; Université de Liège - ULgDepartment of Chemistry > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)
Mertens, Marc; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)
Jérôme, Robert ; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)
Arys, X.; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères
Jonas, Alain M; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères
Legras, Roger; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères
Language :
English
Title :
Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity
The "Région Wallonne " in the frame of a FIRST program BELSPO - SPP Politique scientifique - Service Public Fédéral de Programmation Politique scientifique Cockerill-Sambre R&D F.R.S.-FNRS - Fonds de la Recherche Scientifique The "Direction Générale de la Recherche Scientifique de la Communauté Française de Belgique"
Commentary :
The authors acknowledge Thin Solid Films (Elsevier) for allowing them to archive this paper.
