Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

Calberg, Cédric; Mertens, Marc; Jérôme, Robert; Arys, X.; Jonas, Alain M; Legras, Roger

doi:10.1016/S0040-6090(97)00406-9

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Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

Calberg, Cédric; Mertens, Marc; Jérôme, Robert et al.

1997 • In Thin Solid Films, 310 (1-2), p. 148-155

Peer Reviewed verified by ORBi

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DOI
10.1016/S0040-6090(97)00406-9

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Keywords :

electropolymerization; electrografting

Abstract :

[en] The thickness and roughness of polyacrylonitrile films electrografted on a nickel surface have been measured by ellipsometry, atomic force microscopy and X-ray reflectivity. From combined ellipsometry and X-ray reflectivity measurements, accurate values for the refractive indices of polyacrylonitrile and nickel have been derived at a 6328-Åwavelength. Dependence of the film thickness on the monomer concentration has been quantified for the first time. Furthermore, the thickness of the polyacrylonitrile (PAN) film is related to the nature of the solvent, depending on whether it is a good solvent for PAN (dimethylformamide; DMF) or not (acetonitrile; ACN).

Research Center/Unit :

Center for Education and Research on Macromolecules (CERM)

Disciplines :

Chemistry
Materials science & engineering

Author, co-author :

Calberg, Cédric ; Université de Liège - ULgDepartment of Chemistry > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)

Mertens, Marc; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)

Jérôme, Robert ; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)

Arys, X.; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères

Jonas, Alain M; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères

Legras, Roger; Université catholique de Louvain (UCL) > Unité de Physique et de Chimie des Hauts Polymères

Language :

English

Title :

Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

Publication date :

21 November 1997

Journal title :

Thin Solid Films

ISSN :

0040-6090

Publisher :

Elsevier

Volume :

310

Issue :

1-2

Pages :

148-155

Peer reviewed :

Peer Reviewed verified by ORBi

Additional URL :

http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW0-3W0GHX5-HD-1&_cdi=5548&_user=532038&_orig=search&_coverDate=11%2F21%2F1997&_sk=996899998&view=c&wchp=dGLzVlz-zSkzS&md5=bf0411573920bae3a9d231f9ffcf6eeb&ie=/sdarticle.pdf
http://www.elsevier.com/wps/find/journaldescription.cws_home/504106/description#description

Funders :

The "Région Wallonne " in the frame of a FIRST program
BELSPO - SPP Politique scientifique - Service Public Fédéral de Programmation Politique scientifique
Cockerill-Sambre R&D
F.R.S.-FNRS - Fonds de la Recherche Scientifique
The "Direction Générale de la Recherche Scientifique de la Communauté Française de Belgique"

Commentary :

The authors acknowledge Thin Solid Films (Elsevier) for allowing them to archive this paper.

Available on ORBi :

since 27 July 2009

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