Reference : Improvement of defect detection in shearography by using Principal Component Analysis
Scientific congresses and symposiums : Paper published in a book
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/2268/169198
Improvement of defect detection in shearography by using Principal Component Analysis
English
Vandenrijt, Jean-François mailto [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
Lièvre, Nicolas [> >]
Georges, Marc mailto [Université de Liège - ULiège > > CSL (Centre Spatial de Liège) >]
Aug-2014
Proceedings of Conference on Interferometry XVII: Techniques and Analysis
Yes
No
International
Interferometry XVII: Techniques and Analysis
17-19 August 2014
SPIE
San Diego
USA
Researchers ; Professionals ; Students
http://hdl.handle.net/2268/169198

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