Surface concentration of chain ends in polystyrene determined by static secondary ion mass spectroscopy

Affrossman, S.; Hartshorne, M.; Jérôme, Robert; Pethrick, R. A.; Petitjean, S.; Rei Vilar, M.

doi:10.1021/ma00075a020

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Article (Scientific journals)

Surface concentration of chain ends in polystyrene determined by static secondary ion mass spectroscopy

Affrossman, S.; Hartshorne, M.; Jérôme, Robert et al.

1993 • In Macromolecules, 26 (23), p. 6251-6254

Peer Reviewed verified by ORBi

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https://hdl.handle.net/2268/16235

DOI
10.1021/ma00075a020

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Keywords :

mass spectrometry

Research Center/Unit :

Center for Education and Research on Macromolecules (CERM)

Disciplines :

Chemistry
Materials science & engineering

Author, co-author :

Affrossman, S.; University of Strathclyde, Glasgow, UK > Department of Pure and Applied Chemistry

Hartshorne, M.; University of Strathclyde, Glasgow, UK > Department of Pure and Applied Chemistry

Jérôme, Robert ; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)

Pethrick, R. A.; University of Strathclyde, Glasgow, UK > Department of Pure and Applied Chemistry

Petitjean, S.; Université de Liège - ULiège > Department of Chemistry > Center for Education and Research on Macromolecules (CERM)

Rei Vilar, M.; Thiais, CNRS, France > Laboratoire de Spectrochimie Infrarouge et Raman

Language :

English

Title :

Surface concentration of chain ends in polystyrene determined by static secondary ion mass spectroscopy

Publication date :

08 November 1993

Journal title :

Macromolecules

ISSN :

0024-9297

eISSN :

1520-5835

Publisher :

American Chemical Society, Washington, United States - District of Columbia

Volume :

Issue :

Pages :

6251-6254

Peer reviewed :

Peer Reviewed verified by ORBi

Additional URL :

http://pubs.acs.org/doi/pdf/10.1021/ma00075a020

Funders :

ESF - European Science Foundation
The NFSR

Commentary :

Diblock and triblock copolymers of hydrogenous and deuterated styrene are synthesized to investigate chain-end segregation by static secondary ion mass spectroscopy. Films of the diblocks on silicon wafers show no significant chain-end segregation. In contrast, the triblocks show marked chain-end segregation on silicon wafers with or without the native oxide. Triblocks of isotopic structure D-H-D and H-D-H both showed end-group segregation, suggesting that the surface free energy differences between C-D and C-H are not the dominant factor.

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Bibliography

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