Article (Scientific journals)
Short-term memory for serial order supports vocabulary development: New evidence from a novel word learning paradigm
Majerus, Steve; Boukebza, C.
2013In Journal of Experimental Child Psychology, 116 (4), p. 811-828
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Keywords :
Lexical development; Serial order; Serial position effects; Short-term memory; Verbal working memory; Vocabulary learning
Abstract :
[en] Although recent studies suggest a strong association between short-term memory (STM) for serial order and lexical development, the precise mechanisms linking the two domains remain to be determined. This study explored the nature of these mechanisms via a microanalysis of performance on serial order STM and novel word learning tasks. In the experiment, 6- and 7-year-old children were administered tasks maximizing STM for either item or serial order information as well as paired-associate learning tasks involving the learning of novel words, visual symbols, or familiar word pair associations. Learning abilities for novel words were specifically predicted by serial order STM abilities. A measure estimating the precision of serial order coding predicted the rate of correct repetitions and the rate of phoneme migration errors during the novel word learning process. In line with recent theoretical accounts, these results suggest that serial order STM supports vocabulary development via ordered and detailed reactivation of the novel phonological sequences that characterize new words. © 2013 Elsevier Inc.
Disciplines :
Theoretical & cognitive psychology
Author, co-author :
Majerus, Steve  ;  Université de Liège - ULiège
Boukebza, C.;  Department of Psychology-Cognition and Behavior, Université de Liège, B-4000 Liège, Belgium
Language :
English
Title :
Short-term memory for serial order supports vocabulary development: New evidence from a novel word learning paradigm
Publication date :
2013
Journal title :
Journal of Experimental Child Psychology
ISSN :
0022-0965
eISSN :
1096-0457
Publisher :
Elsevier, Atlanta, United States - New York
Volume :
116
Issue :
4
Pages :
811-828
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 16 October 2013

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