Abstract :
[en] We present a new 3D full-frame profilometer based on structured laser light projection method. This device takes
advantage of the polarization states splitting technique for producing and shifting multiple sinusoidal Young’s
interference patterns that are projected on the inspected surface. The principle of the technique is presented and we
discuss the advantages of monochromatic light projection method as a mean to overcome ambient lighting for in-situ
measurement. Some results that we obtained on objects from the Egyptian Department of the British Museum are
presented to demonstrate that 3D laser profilometry is a worthwhile technique for epigraphic investigations where
naked-eye inspections fail.
Name of the research project :
OSIRIS (Optical Systems for Interferometric Relief Investigation and Scanning)
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