Electrical characterization by admittance spectroscopy : from impurity identification to interface analysis in nanostructures

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Scientific conference in universities or research centers (Scientific conferences in universities or research centers)

Nguyen, Ngoc Duy

2013

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https://hdl.handle.net/2268/146616

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Disciplines :

Physics

Author, co-author :

Nguyen, Ngoc Duy ; Université de Liège - ULiège > Département de physique > Physique des solides, interfaces et nanostructures

Language :

English

Title :

Electrical characterization by admittance spectroscopy : from impurity identification to interface analysis in nanostructures

Publication date :

10 April 2013

Event name :

Coloquio do Departamento de Física da Universidade Federal de São Carlos

Event date :

10/04/2013

Available on ORBi :

since 10 April 2013

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